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NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
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GB/T 26070-2010
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Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method |
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Issued Date: |
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Implemented Date: |
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Issued by: |
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The Standardization Administration of the People's Republic of China |
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Thanks for your interest in
"GB/T 26070-2010" standard !
This GB standard english version is not ready translated, only after get your order, then we translate it, time usually need more 3-5 days .
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| GB Standard Code |
GB/T 26070-2010 |
| Standard Category |
China National Standards |
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GB Standard English Title |
Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method |
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GB Standard Chinese Title |
化合物半导体抛光晶片亚表面损伤的反射差分谱测试方法 |
| Chinese Version Price |
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| English Translation Fee |
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